DOI: 10.1016/j.scib.2020.08.008
论文题名: Understanding angle-resolved polarized Raman scattering from black phosphorus at normal and oblique laser incidences
作者: Lin M.-L. ; Leng Y.-C. ; Cong X. ; Meng D. ; Wang J. ; Li X.-L. ; Yu B. ; Liu X.-L. ; Yu X.-F. ; Tan P.-H.
刊名: Science Bulletin
ISSN: 20959273
出版年: 2020
卷: 65, 期: 22 起始页码: 1894
结束页码: 1900
语种: 英语
中文关键词: Angle-resolved polarized Raman scattering
; Anisotropic layered material
; Birefringence
; Complex refractive index
; Linear dichroism
; Real Raman tensor
英文关键词: Anisotropy
; Birefringence
; Black Phosphorus
; Dichroism
; Electric excitation
; Group theory
; Induced polarization logging
; Phonons
; Phosphorus
; Polarization
; Raman spectroscopy
; Refractive index
; Tensors
; Anisotropic crystals
; Excitation wavelength
; Fitting parameters
; Interference effects
; Isotropic materials
; Multi-layered structure
; Multilayered substrates
; Raman intensities
; Laser excitation
英文摘要: The selection rule for angle-resolved polarized Raman (ARPR) intensity of phonons from standard group-theoretical method in isotropic materials would break down in anisotropic layered materials (ALMs) due to birefringence and linear dichroism effects. The two effects result in depth-dependent polarization and intensity of incident laser and scattered signal inside ALMs and thus make a challenge to predict ARPR intensity at any laser incidence direction. Herein, taking in-plane anisotropic black phosphorus as a prototype, we developed a so-called birefringence-linear-dichroism (BLD) model to quantitatively understand its ARPR intensity at both normal and oblique laser incidences by the same set of real Raman tensors for certain laser excitation. No fitting parameter is needed, once the birefringence and linear dichroism effects are considered with the complex refractive indexes. An approach was proposed to experimentally determine real Raman tensor and complex refractive indexes, respectively, from the relative Raman intensity along its principle axes and incident-angle resolved reflectivity by Fresnel's law. The results suggest that the previously reported ARPR intensity of ultrathin ALM flakes deposited on a multilayered substrate at normal laser incidence can be also understood based on the BLD model by considering the depth-dependent polarization and intensity of incident laser and scattered Raman signal induced by both birefringence and linear dichroism effects within ALM flakes and the interference effects in the multilayered structures, which are dependent on the excitation wavelength, thickness of ALM flakes and dielectric layers of the substrate. This work can be generally applicable to any opaque anisotropic crystals, offering a promising route to predict and manipulate the polarized behaviors of related phonons. © 2020 Science China Press Citation statistics:
资源类型: 期刊论文
标识符: http://119.78.100.158/handle/2HF3EXSE/169978
Appears in Collections: 气候变化与战略
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作者单位: State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China; Center of Materials Science and Optoelectronics Engineering & CAS Center of Excellence in Topological Quantum Computation, University of Chinese Academy of Sciences, Beijing, 100049, China; Shenzhen Engineering Center for the Fabrication of Two-Dimensional Atomic Crystals, Shenzhen Institutes of Advanced Technology, Chinese Academy of Sciences, Shenzhen, 518055, China; College of Physics Science and Technology, Hebei University, Baoding, 071002, China; Beijing Academy of Quantum Information Science, Beijing, 100193, China
Recommended Citation:
Lin M.-L.,Leng Y.-C.,Cong X.,et al. Understanding angle-resolved polarized Raman scattering from black phosphorus at normal and oblique laser incidences[J]. Science Bulletin,2020-01-01,65(22)