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Snow albedo sensitivity to macroscopic surface roughness using a new ray-tracing model [期刊论文]
Cryosphere, 2020-01-01, 14 (5
Larue F.;  Picard G.;  Arnaud L.;  Ollivier I.;  Delcourt C.;  Lamare M.;  Tuzet F.;  Revuelto J.;  Dumont M.
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